connect:ID reveals far-reaching conference agenda
08 March 2016 17:09 GMT

Organisers of the next-generation human identity conference and exhibition, connect:ID 2016, have just launched a far-reaching agenda. Issues such as identity fraud, privacy protection, mobility, biometrics and next-generation credentials run through the heart of the program, which has more than 100 speakers.

The event – organised by Science Media Partners and the International Biometrics + Identity Association (IBIA) – takes place March 14-16, 2016, at the Walter E Washington Convention Center, Washington DC.

The program reveals two influential Congressmen as latest additions to the keynote line up. They will be addressing the audience on critical issues such as border security, biometric Entry-Exit and security in the aviation system.

On 14 March, Congressman Will Hurd, (TX-23) Vice Chair of the Border and Maritime Security Subcommittee, House Homeland Security Committee will deliver the Opening Address. Hurd is responsible for oversight of all relevant aspects of visa, border, port and maritime security including, TWIC, the Visa Waiver Program, and Biometric Entry-Exit.

On the same day, Congressman John M. Katko (NY-24), Chair of the Transportation Security Subcommittee, House Homeland Security Committee, will also speak. Katko has sole jurisdiction over all Transportation Security Administration (TSA) security matters, including the security of passengers and cargo within the US aviation system.

The innovative conference program also includes a high-profile Congressional Panel on Biometric entry/exit, an interactive session by DHS's Apex Air Entry/Exit Re-engineering team, and streams covering Identity and Mobile devices, wearables, IOT, payments, societal inclusion, m-driving licenses, ePassports, identity fraud, and more.

An overview of the conference details and exclusive interviews with speakers and exhibitors can be seen in the event's newly launched event guide.

If you are interested in attending the connect:ID 2016 conference or exhibition, click here to purchase a conference pass or here to visit the free-to-attend exhibition.

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